761. Wideband transistors and wideband hybride IC modules
پدیدآورنده :
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : Handbook, manuals, etc. ، Transistor,Handbooks, manuals, etc. ، Integrated circuits,Handbooks, manuals, etc. ، Modulation )Electronics(
762. 1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Congresses ، Semiconductors,Congresses ، Optoelectronic Devices,Congresses ، Microwave integrated circuits
رده :
TK
7871
.
85
.
W664
1997
763. 1997 Workshop on High Performance Electron Devices for Microwave and optoelectronic Applications, EDMO
پدیدآورنده : Workshop on High Performance Electron Devices for Microwave and optoelectronic )7991: University of London(
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Semiconductors- Congresses,، Optoelectronic devices- Congresses,، Microwave integrated circuits- Congresses,، Bipolar transistors- Congresses
رده :
TK
7871
.
85
.
W664
1997
764. X-ray metrology in semiconductor manufacturing
پدیدآورنده : Bowen, D. Keith )David Keith(
موضوع : ، Semiconductors-- Design and construction Quality control,، Integrated circuits-- Measurement,، Semiconductor wafers-- Inspection,، X-rays-- Diffraction,، Fluroscopy
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
765. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Design and construction--Quality control,Integrated circuits--Measurement,Semiconductor wafers--Inspection,X-rays--Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
766. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : Semiconductors- Design and construction- Quality control,Integrated circuits- Measurement,Semiconductor wafers- Inspection,X-rays- Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
767. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
رده :
E-BOOK
768. Xicor data book
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Handbooks, manuals, etc. ، Semiconductor storage devices,Handbooks, manuals, etc. ، Integrated circuits,Handbooks, manuals, etc. ، Metals oxide semiconductors
رده :
TK
7895
.
M4
.
X529
1987
769. delay defects-Test and diagnosis for small
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;
770. low power applications-depleted SOI CMOS circuits and technology for ultra-Fully
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : insulator technology. ; Low voltage systems. ; Integrated circuits ; Very large scale integration. ; -on-Metal oxide semiconductors, Complementary. ; Silicon
771. medical CMOS ICs-Bio
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Mechanical Systems ; instrumentation. ; Semiconductors ; instrumentation. ; Biomedical Engineering ; instrumentation. ; Electronics, Medical ; instrumentation. ; Remote S-Electrical-Metal oxide semiconductors, Complementary. ; Integrated circuits. ; Micro
772. metric CMOS VLSI circuits-oriented testing for nano-Defect
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;
773. mode sensor interfacing applications-mode and current-Analog circuits and systems for voltage
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Integrated circuits. ; Metal oxide semiconductors, Complementary ; Design. ;
774. proceedings of the 6th International Symposium on Power Semiconductor Devices & ICs: ISPSD 94, May 31-June 2, 1994 Davos, Switzerland
پدیدآورنده : Edited by: Wolfgang Fichtner, Andre A. Jaecklin, Dolf Aemmer; Co-sponsors: Swiss Federal Institute of Technology )ETH( ... ]et al.[
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Power electronics - Congresses , Power semiconductors - Congresses , Integrated circuits - Congresses
رده :
TK
7881
.
15
.
I59
1994